Three-dimensional nanothermometry below the diffraction limit

authored by

J. Thiem, S. Spelthann, J. Neumann, A. Ruehl, D. Ristau

Abstract

Lanthanide-doped nanothermometers are used to measure temperature through changes in their emission characteristic with sensitivities of up to a few %/K. In contrast to their sensitivity, their spatial resolution, which is of critical importance for various applications, has not been thoroughly studied and optimized. We numerically investigated the improvement in spatial resolution of nanothermometers with a stimulated emission depletion microscopy approach. Fundamental relationships between spatial and temperature resolution were identified by using different beam parameters for the excitation and depletion beams. Our simulations predict contactless temperature measurement below the diffraction limit with temperature resolution of ±1.25 K. We further studied the influence of sample thickness and position on both temperature and spatial resolution and showed the potential of three-dimensional measurements.

Organisation(s)

Institute of Quantum Optics
PhoenixD: Photonics, Optics, and Engineering - Innovation Across Disciplines

External Organisation(s)

Laser Zentrum Hannover e.V. (LZH)
QUANOMET: Research area quantum and nanometrology of the research alliance Braunschweig-Hannover

Type

Article

Journal

Optics letters

Volume

46

Pages

3352-3355

No. of pages

4

ISSN

0146-9592

Publication date

15.07.2021

Publication status

Published

Peer reviewed

Yes

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics

Electronic version(s)

https://doi.org/10.1364/OL.423626 (Access: Closed)