Optimizing the laser diode ray tracing model for LERP system simulation based on likelihood image sampling
- authored by
- Elisavet Chatzizyrli, Moritz Hinkelmann, Angeliki Afentaki, Roland Lachmayer, Jörg Neumann, Dietmar Kracht
- Abstract
Ray tracing software is a powerful tool for optical system analysis that provides built-in laser source models. However, these models prove to be inadequate for laser beams with a factor of M 2 far from one, as is the case for high-power multi-mode laser diodes. In certain applications, accurate prediction of the beam shape can be critical to simulation model performance; in opto-thermal simulations of laser-excited remote phosphor (LERP) systems [1] , [2] , overestimation of the high intensity region of the beam can lead to overestimation of the phosphor temperatures calculated. For this reason, a ray tracing laser diode source model was developed based on random sampling from the weighted (likelihood) image of the experimentally measured beam profile.
- Organisation(s)
-
Institute of Motion Engineering and Mechanism Design
PhoenixD: Photonics, Optics, and Engineering - Innovation Across Disciplines
- External Organisation(s)
-
Laser Zentrum Hannover e.V. (LZH)
- Type
- Conference contribution
- Publication date
- 2021
- Publication status
- Published
- Peer reviewed
- Yes
- ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials, Mechanics of Materials
- Electronic version(s)
-
https://doi.org/10.1109/CLEO/Europe-EQEC52157.2021.9542784 (Access:
Closed)