Optimizing the laser diode ray tracing model for LERP system simulation based on likelihood image sampling

authored by
Elisavet Chatzizyrli, Moritz Hinkelmann, Angeliki Afentaki, Roland Lachmayer, Jörg Neumann, Dietmar Kracht
Abstract

Ray tracing software is a powerful tool for optical system analysis that provides built-in laser source models. However, these models prove to be inadequate for laser beams with a factor of M 2 far from one, as is the case for high-power multi-mode laser diodes. In certain applications, accurate prediction of the beam shape can be critical to simulation model performance; in opto-thermal simulations of laser-excited remote phosphor (LERP) systems [1] , [2] , overestimation of the high intensity region of the beam can lead to overestimation of the phosphor temperatures calculated. For this reason, a ray tracing laser diode source model was developed based on random sampling from the weighted (likelihood) image of the experimentally measured beam profile.

Organisation(s)
Institute of Motion Engineering and Mechanism Design
PhoenixD: Photonics, Optics, and Engineering - Innovation Across Disciplines
External Organisation(s)
Laser Zentrum Hannover e.V. (LZH)
Type
Conference contribution
Publication date
2021
Publication status
Published
Peer reviewed
Yes
ASJC Scopus subject areas
Electronic, Optical and Magnetic Materials, Mechanics of Materials
Electronic version(s)
https://doi.org/10.1109/CLEO/Europe-EQEC52157.2021.9542784 (Access: Closed)