Three-dimensional nanothermometry below the diffraction limit

verfasst von

J. Thiem, S. Spelthann, J. Neumann, A. Ruehl, D. Ristau

Abstract

Lanthanide-doped nanothermometers are used to measure temperature through changes in their emission characteristic with sensitivities of up to a few %/K. In contrast to their sensitivity, their spatial resolution, which is of critical importance for various applications, has not been thoroughly studied and optimized. We numerically investigated the improvement in spatial resolution of nanothermometers with a stimulated emission depletion microscopy approach. Fundamental relationships between spatial and temperature resolution were identified by using different beam parameters for the excitation and depletion beams. Our simulations predict contactless temperature measurement below the diffraction limit with temperature resolution of ±1.25 K. We further studied the influence of sample thickness and position on both temperature and spatial resolution and showed the potential of three-dimensional measurements.

Organisationseinheit(en)

Institut für Quantenoptik
PhoenixD: Simulation, Fabrikation und Anwendung optischer Systeme

Externe Organisation(en)

Laser Zentrum Hannover e.V. (LZH)
QUANOMET: Forschungslinie Quanten- und Nanometrologie der Wissenschaftsallianz Braunschweig-Hannover

Typ

Artikel

Journal

Optics letters

Band

46

Seiten

3352-3355

Anzahl der Seiten

4

ISSN

0146-9592

Publikationsdatum

15.07.2021

Publikationsstatus

Veröffentlicht

Peer-reviewed

Ja

ASJC Scopus Sachgebiete

Atom- und Molekularphysik sowie Optik

Elektronische Version(en)

https://doi.org/10.1364/OL.423626 (Zugang: Geschlossen)