Optimizing the laser diode ray tracing model for LERP system simulation based on likelihood image sampling

verfasst von

Elisavet Chatzizyrli, Moritz Hinkelmann, Angeliki Afentaki, Roland Lachmayer, Jörg Neumann, Dietmar Kracht

Abstract

Ray tracing software is a powerful tool for optical system analysis that provides built-in laser source models. However, these models prove to be inadequate for laser beams with a factor of M 2 far from one, as is the case for high-power multi-mode laser diodes. In certain applications, accurate prediction of the beam shape can be critical to simulation model performance; in opto-thermal simulations of laser-excited remote phosphor (LERP) systems [1] , [2] , overestimation of the high intensity region of the beam can lead to overestimation of the phosphor temperatures calculated. For this reason, a ray tracing laser diode source model was developed based on random sampling from the weighted (likelihood) image of the experimentally measured beam profile.

Organisationseinheit(en)

Institut für Produktentwicklung und Gerätebau
PhoenixD: Simulation, Fabrikation und Anwendung optischer Systeme

Externe Organisation(en)

Laser Zentrum Hannover e.V. (LZH)

Typ

Aufsatz in Konferenzband

Publikationsdatum

2021

Publikationsstatus

Veröffentlicht

Peer-reviewed

Ja

ASJC Scopus Sachgebiete

Elektronische, optische und magnetische Materialien, Werkstoffmechanik

Elektronische Version(en)

https://doi.org/10.1109/CLEO/Europe-EQEC52157.2021.9542784 (Zugang: Geschlossen)